Characterization
Next facilities for thin films characterization are available to use:
| 1 | Scanning Near Field Optical Microscope (Atomic Force Microscope) - Alpha SNOM WiTec |
| 2 | Prifilometer - Tencor (alppha-step 200) |
| 3 | UV-VIS-NIR Spectrophotometer - CARY 500 |
Staff:
Dr. Alexey Bykov 212-650-5548
Hours:
Contact Dr. Alexey Bykov to schedule
